Showing results: 256 - 270 of 309 items found.
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FIME SAS
Improve product performance with thorough testing services that certify your product against all relevant standards and specifications. FIME is an independent global leader in integration testing services for smart devices and secure chip-based applications and has more than 15 years’ experience of working in the telecom, e-payment, transport, e-identity and logistic sectors. A recognised expert in Near Field Communication (NFC) testing, FIME was the first laboratory to provide contactless smart card testing and to perform accelerated ageing tests to monitor the behaviour of products throughout their lifecycle.
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Arbin Instruments
Arbin's Laboratory Battery Testing (LBT) series commercializes technology established during a 3year ARPA-E project developing ultrahigh precision testing systems. This product consists of independent potentiostat/galvanostat channels for testing batteries and other energy storage devices, and is intended to provide an economical solution for applications requiring highprecision measurements and fast data sampling. All Arbin testing systems come with a PC preloaded with our MITS Pro and Data Watcher software for creating test profiles, realtime data monitoring, and data plotting & analysis.
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Series 6800 -
Pacific Instruments, Inc.
Based completely on the Series 6000 hardware and software platform, Series 6800 is a turnkey system configured for specific measurement types and environments. Systems are available for Strain/Bridge, Voltage/IEPE, Thermocouple and packaged for laboratory or portable applications. Systems range in channel count from 8 to 128 channels and can be easily expanded, should test requirements change. Included turnkey software helps facilities focus on testing, not developing software. If you don’t see a configuration that fits your application, we can likely build a system specific to your needs.
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Keysight Technologies
Conducting all the parametric measurements necessary for the numerous test structures on a semiconductor wafer can be a time-consuming and expensive process. With the cost of end-user devices continuing to drop, even laboratory characterization environments must reduce the cost of test. Until now engineers and scientists working on current and future semiconductor process technologies were faced with a difficult choice: either use a semiconductor parameter analyzer with positioners on a wafer prober, which limits the ability to perform automated test, or use a switching matrix and probe card, which reduced the analyzer's measurement resolution. Utilizing a switching matrix with a semi-automatic or fully-automatic wafer prober enables characterization tests to be automated, eliminating the need to have an operator manually reposition the probes each time a new module needs to be tested. This reduces both test time and cost. Due to the many price/performance points available, Keysight's switching matrix solutions provide the flexibility to choose exactly what your testing needs require, without overspending.
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METRISO Series -
GMC-I Messtechnik GmbH
1) Voltage-free devices and equipment, for rugged service applications and laboratory use2) Voltage-free devices and equipment, and for testing resistance at earthing, protective and equipotential bonding conductors3) Voltage-free electrical devices and equipment, for testing resistance at earthing, protective and equipotential bonding conductors, and for testing devices under test for absence of voltage. - METRISO C only: testing floor coverings for discharge capability and electrostatic charging4) Electrical systems, machines, transformers, cables and equipment used in, for example, locomotives, street cars and ocean going vessels5) Electrical motors, machines, generators and cables
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779114-01 -
NI
32 AI (16-Bit, 250 kS/s), 48 DIO, PXI Multifunction I/O Module—The PXI‑6224 offers analog input, correlated digital I/O, two 32‑bit counter/timers, and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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779068-01 -
NI
32 AI (16-Bit, 250 kS/s), 4 AO, 48 DIO PCI Multifunction I/O Device - The PCI-6229 offers analog I/O, correlated digital I/O, two 32-bit counters/timers, and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI-DAQmx driver and configuration utility simplify configuration and measurements.
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779122-01 -
NI
32 AI (18-Bit, 625 kS/s), 48 DIO, PXI Multifunction I/O Module—The PXI‑6284 offers analog input, correlated digital I/O, two 32‑bit counter/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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779110-01 -
NI
32 AI (18-Bit, 625 kS/s), 48 DIO PCI Multifunction I/O Device - The PCI‑6284 offers analog input, correlated digital I/O, two 32‑bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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779295-01 -
NI
80 AI (16-Bit, 250 kS/s), 2 AO, 24 DIO PCI Multifunction I/O Device - The PCI‑6225 offers analog I/O, correlated digital I/O, two 32-bit counters/timers, and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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779120-01 -
NI
16 AI (18-Bit, 625 kS/s), 24 DIO, PXI Multifunction I/O Module—The PXI‑6280 offers analog input, correlated digital I/O, two 32‑bit counter/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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779108-01 -
NI
16 AI (18-Bit, 625 kS/s), 24 DIO PCI Multifunction I/O Device - The PCI‑6280 offers analog input, correlated digital I/O, two 32‑bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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779418-01 -
NI
16 AI (16-Bit, 250 kS/s), 2 AO, 24 DIO PCI Multifunction I/O Device - The PCI-6221 offers analog I/O, correlated digital I/O, two 32-bit counters/timers, and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI-DAQmx driver and configuration utility simplify configuration and measurements.
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Mountz Inc.
If torque tools slip out of calibration, that could impact the quality of your products. Having an accurate way to regularly test calibration onsite is a great way to reduce risk and ensure safety. With Mountz torque analyzers and sensors, you can test tools before they go into service every day. This prevents employees from working with miscalibrated tools and enhances quality management. It’s also more efficient to use your own torque testing equipment since you can evaluate your tools without sending them to a laboratory. Whether you want stand-alone sensors for hand and power torque tools or run down adapters that simulate actual joint conditions, Mountz has many options to choose from.
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OPTOWERE-S100 (Fiber Optic Test System) -
Notice
The frame of FOTS system consists of the Main control part and the Slot mounting part. The Main control part is in charge of control and interface of the system and the Slot mounting part can hold up to maximum 8 slots, which are modularized according to each function and come out in five kinds. This integrated test system is designed to help manage the test and measurement related to optical communication and component. And the modular architecture of FOTS allows for customized configuration so that the slot of LD Driver, 2 channel VOA, 1 X 4 switch, WDM EDFA and C + L – Band ASE Source can be chosen according to user’s necessities. Main control part and each function module are run by effective and multi-functioned system control program in the base of high speed remote interface, GUI display and the discriminative high speed driving of module and system. This system can provide variety manufacturing and laboratory applications such as general quality test and reliability test of optical component and optical signal transmission test through efficient linkage with other system.
